Electrothermal Analysis of VLSI Systems by Yi-Kan Cheng
|Title||Electrothermal Analysis of VLSI Systems|
|Publisher||Springer Science & Business Media|
|Category||Technology & Engineering|
|Language||English, Spanish, and French|
This useful book addresses electrothermal problems in modern VLSI systems. It discusses electrothermal phenomena and the fundamental building blocks that electrothermal simulation requires. The authors present three important applications of VLSI electrothermal analysis: temperature-dependent electromigration diagnosis, cell-level thermal placement, and temperature-driven power and timing analysis.